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ContDLC Contact Mode AFM Probe with Diamond-Like-Carbon Tip Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
AFM Cantilever
Coating
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick;Aluminum coating on detector side of the cantilever, 30 nm thick
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
Additional Info
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the AFM cantilever.
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
Consistent high quality at a lower price!
