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ContGB-G Contact Mode AFM Probe with Gold Overall Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
AFM Cantilever
Coating
Overall gold coating, 70 nm thick
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
Additional Info
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Not recommended for electric applications on abrasive sample surfaces!
Consistent high quality at a lower price!
