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ContAl-G Contact Mode AFM Probe with Aluminum Reflective Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
AFM Cantilever
Coating
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
Additional Info
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G!
Consistent high quality at a lower price!
