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- ElectriTap190-G
ElectriTap190-G Tapping Mode AFM Probe with Long Cantilever and Platinum Overall Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
AFM Cantilever
Coating
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Alignment Grooves
This product features alignment grooves on the back side of the holder chip.
Additional Info
Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:
- scanning capacitance microscopy (SCM)
- electrostatic force microscopy (EFM)
- Kelvin probe force microscopy (KFM)
- scanning probe lithography
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
BudgetSensors' Tap190 series features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.
Consistent high quality at a lower price!
