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SiNi Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip
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SiNi-10
(10 per set)
1 x 255.00 USD = 255.00
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SiNi-30
(30 per set)
1 x 695.00 USD = 695.00
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SiNi-100
(100 per set)
1 x 2 200.00 USD = 2 200.00
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SiNi-300
(300 per set)
1 x 5 400.00 USD = 5 400.00
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AFM Probe Specifications:
AFM Tip
Shape
Pyramid
Height
12 µm
(10 - 14 µm)*
(10 - 14 µm)*
Radius
15 nm
Half Cone Angle
35° (macroscopic)
4 AFM Cantilevers
Short Cantilever
Triangle
0.27 N/m
30 kHz
100 µm
(90 - 110 µm)*
16 µm
(11 - 21 µm)*
520 nm
(470 - 570 nm)*
Long Cantilever
Triangle
0.06 N/m
10 kHz
200 µm
(190 - 210 µm)*
30 µm
(25 - 35 µm)*
520 nm
(470 - 570 nm)*
* typical range
Coating
Gold/Chromium on detector side of the cantilever, 70 nm thick
Alignment Grooves
none
Additional Info
This competitively priced silicon nitride AFM probe features:
- 2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
- silicon nitride wedge AFM tip
- overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
- macroscopic half cone angle of 35°
- 450 micron thick silicon holder chip
Consistent high quality at a lower price!
