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All-In-One-Al Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating
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AFM Probe Specifications:
AFM Tip
(15 - 19 µm)*
(10 - 20 µm)*
4 AFM Cantilevers
Coating
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Alignment Grooves
none
Additional Info
Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode.
The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.
Please note that the aluminum back side coating is not suitable for measurements in liquids!
Consistent high quality at a lower price!
