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Magnetic Force Microscopy (MFM) AFM Probes
AFM probe Model Multi75M-G Order Online: AFM probe Model Multi75M-G
AFM Probe Model: MagneticMulti75-G

MagneticMulti75-G AFM 探针

  适用范围:  磁力显微镜设备(MFM)
  概述:  旋转的单晶硅探针, 对称针尖
芯片尺寸: 3.4×1.6×0.3 mm
调节凹槽
  涂层:  针尖侧上 —磁性覆盖层
探测器侧上—铝覆盖层
数值 变化 范围
振动频率 75 kHz ± 15 kHz
力常数 3 N/m 1 N/m to 7 N/m
长度 225 µm ± 10 祄
平均宽度 28 µm ± 5 祄
厚度 3 µm ± 1 µm
针尖高度 17 µm ± 2 µm
弯曲度 15 µm ± 5 µm
针尖半径 < 60 nm
反射涂层 针尖侧上 —磁性覆盖层,
探测器侧上—铝覆盖层
半圆锥角 沿着悬臂轴为 20°-25°
从侧面看为 25°-30°
在针尖部为 10°
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