AFM Tip, Conductive AFM probes, Alignment Grooves

english \| español \| customer login

» AFM Tip

» AFM Cantilever

» AFM Holder chip

» Available Package Sizes
and Prices

« Back to product specs

« Back to Conductive
AFM Probes

Download Product Datasheet

AFM Probe Model: ElectriMulti75-G
application:	Force Modulation, Pulsed Force Mode (PFM) and electric modes measurements

general:	Rotated Monolithic silicon probe Symmetric tip shape Chipsize 3.4 x 1.6 x 0.3 mm Alignment Grooves

coating:	Electrically conductive coating

AFM probe Model ElectriMulti75-G - AFM Tip

The AFM tip is micromachined, monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 25 nm gives good resolution and reproducibility.

This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm.

Part of NanoWorld Group

Electric Modes Measurements:

• Scanning Capacitance Microscopy (SCM),
• Electrostatic Force Microscopy (EFM),
• Kelvin probe Force Microscopy (KFM),
• Scanning probe lithography
• Other Electric Modes

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Probe Model: ElectriMulti75-G