Conductive AFM probes

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AFM Probes

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AFM Probe Model: ElectriCont-G
application:	Contact Mode and electric modes measurements

general:	Rotated Monolithic silicon probe Symmetric tip shape Chipsize 3.4 x 1.6 x 0.3 mm Alignment Grooves

coating:	Electrically conductive coating

	value	range
Resonant Frequency	13 kHz	± 4 kHz
Force Constant	0.2 N/m	0.07 N/m to 0.4 N/m
Length	450 µm	± 10 µm
Mean Width	50 µm	± 5 µm
Thickness	2 µm	± 1 µm
Tip Height	17 µm	± 2 µm
Tip Set back	15 µm	± 5 µm
Tip Radius	< 25 nm
Coating	Conductive Cr/Pt on both sides
Half Cone Angle	20°-25° along cantilever axis 25°-30° from side 10° at the apex
Contact Resistance	300 Ohms on platinum thin film surface

Part of NanoWorld Group

Electric Modes Measurements:

. Scanning Capacitance Microscopy (SCM),
. Electrostatic Force Microscopy (EFM),
. Kelvin probe Force Microscopy (KFM),
. Scanning probe lithography
. Other Electric Modes

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Probe Model: ElectriCont-G