 |
AFM Probe Model: Contact |
| application: |
Contact Mode |
 |
| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm |
|
| coating: |
none [Al Reflex - optional] |
|
technical
data: |
Resonant Frequency - 13 kHz
Force Constant - 0.2 N/m |
|
 |
The AFM cantilever is micromachined, monolithic Silicon, exhibiting excellent uniformity.
It provides high quality imaging for all standard atomic force microscopes (AFMs). |
|
