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AFM Probe Model: ContAl-G |
| application: |
Contact Mode |
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| general: |
Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment Grooves |
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| coating: |
Aluminium reflex coating,
30 nm thick |
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technical
data: |
Resonant Frequency - 13 kHz
Force Constant - 0.2 N/m |
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The AFM tip is micromachined, monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 10 nm gives good resolution and reproducibility.
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm. |
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