AFM probe, Conductive AFM probes

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For all our silicon AFM probes,
we offer an electrically conductive Chromium/Platinum coating on both sides of the cantilever.

This coating also enhances the laser reflectivity of the cantilever.

NEW » The latest product addition
to this product group is the ElectriMulti75-G, which is a an electrically conductive Force Modulation Mode AFM probe with
Alignment grooves on the back side
of the holder chip.

All Products in this group are suitable for electric modes like: • Scanning Capacitance Microscopy (SCM), • Electrostatic Force Microscopy (EFM), • Kelvin probe Force Microscopy (KFM), • Scanning probe lithography We feature following conductive AFM probe types: AFM Probe Model ElectriTap300 for Tapping, Intermittent Contact and electric modes AFM Probe Model ElectriMulti75 for Force Modulation, Pulsed Force Mode (PFM) and electric modes NEW » AFM Probe Model ElectriMulti75-G for Force Modulation, Pulsed Force Mode (PFM) and electric modes, Alignment Grooves AFM Probe Model ElectriCont for Contact Mode and electric modes

Part of NanoWorld Group